The effects of gas mixing and plasma electrode position on the emittance of an electron cyclotron resonance ion source
Creators
- 1. Department of Physics, Accelerator Laboratory, University of Jyvaeskylae (JYFL), P.O. Box 35, FIN-40351, Jyvaeskylae (Finland)
Description
Gas mixing is a commonly used method to improve the intensities and the charge state distribution of ion beams extracted from an electron cyclotron resonance ion source (ECRIS). At the same time, the emittance of the ion beam should be as small as possible. In this work we have studied the effect of the gas mixing method on the ion beam quality by measuring the emittance and brightness of different ion beams using helium, oxygen, and argon with several gas feeding ratios. All measurements were performed with the JYFL 6.4 GHz ECRIS. At the second stage of the experiments the emittance and the ion beam brightness were studied as a function of the plasma electrode position. The extraction system constructed for this experiment can be moved online
Additional details
Identifiers
- DOI
- 10.1063/1.1691505;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 75
- Journal Issue
- 5
- Journal Page Range
- p. 1517-1519
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- 10. international conference on ion sources (ICIS)
- Dates
- 8-13 Sep 2003
- Place
- Dubna (Russian Federation)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36010303
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON; BRIGHTNESS; CHARGE STATES; CYCLOTRON RESONANCE; ECR ION SOURCES; ELECTRODES; EXTRACTION; GHZ RANGE 01-100; HELIUM; ION BEAMS; PARTICLE BEAMS; PLASMA
- Descriptors DEC
- BEAMS; ELEMENTS; FLUIDS; FREQUENCY RANGE; GASES; GHZ RANGE; ION SOURCES; NONMETALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RARE GASES; RESONANCE; SEPARATION PROCESSES
Optional Information
- Notes
- (c) 2004 American Institute of Physics.