Investigation of mechanical losses of thin silicon flexures at low temperatures
Creators
- 1. Institut für Festkörperphysik, Friedrich-Schiller-Universität Jena, Helmholtzweg 5, D-07743 Jena (Germany)
- 2. SUPA, Institute for Gravitational Research, University of Glasgow, G12 8QQ (United Kingdom)
- 3. Institut für Angewandte Physik, Friedrich-Schiller-Universität Jena, Albert-Einstein-Straße 15, D-07745 Jena (Germany)
Description
Studies of the mechanical loss of silicon flexures in a temperature region from 5 to 300 K are presented, where the flexures have been prepared by different fabrication techniques of interest for the construction of suspension elements of future interferometric gravitational wave detectors. A lowest mechanical loss of 3 × 10−8 was observed for a 130 μm thick flexure at around 10 K. While the mechanical loss follows the thermo-elastic predictions down to 50 K, at lower temperatures the observed loss is found to be a function of surface roughness. This surface loss is of interest for all applications using silicon-based oscillators at low temperatures. The extraction of a surface loss parameter using results from our measurements and those of other authors is presented and the relevance for future gravitational wave detector suspensions is discussed. A surface loss parameter αs = 0.5 pm was obtained. This reveals that the surface loss of silicon is significantly lower than the surface loss of fused silica. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0264-9381/30/11/115008Additional details
Identifiers
Publishing Information
- Journal Title
- Classical and Quantum Gravity
- Journal Volume
- 30
- Journal Issue
- 11
- Journal Page Range
- [12 p.]
- ISSN
- 0264-9381
- CODEN
- CQGRDG
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44069496
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- GRAVITATIONAL WAVE DETECTORS; LOSSES; OSCILLATORS; ROUGHNESS; SILICA; SILICON; SURFACES; SUSPENSIONS; TEMPERATURE RANGE 0065-0273 K
- Descriptors DEC
- DISPERSIONS; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; MEASURING INSTRUMENTS; MINERALS; OXIDE MINERALS; RADIATION DETECTORS; SEMIMETALS; SURFACE PROPERTIES; TEMPERATURE RANGE