Published May 15, 2009
| Version v1
Journal article
CdS thin films obtained by thermal treatment of cadmium(II) complex precursor deposited by MAPLE technique
Creators
- 1. INFLPR - National Institute for Laser, Plasma and Radiation Physics, PPAM - Lasers Department, 409 Atomistilor Bvd., Magurele RO-077125, Bucharest (Romania)
- 2. Gdansk University of Technology, Chemistry Faculty, 11/12 G. Narutowicza Str., PL-90-233 Gdansk (Poland)
- 3. University of Craiova, Faculty of Physics, 13 A.I. Cuza St., Craiova RO-200585, Dolj (Romania)
- 4. INOE 2000 - National Institute for Optoelectronics, 1 Atomistilor Bvd., Magurele RO-077125, Bucharest (Romania)
Description
Thin films of [Cd{SSi(O-But)3}(S2CNEt2)]2, precursor for semiconducting CdS layers, were deposited on silicon substrates by Matrix-Assisted Pulsed Laser Evaporation (MAPLE) technique. Structural analysis of the obtained films by Fourier transform infrared spectroscopy (FTIR) confirmed the viability of the procedure. After the deposition of the coordination complex, the layers are manufactured by appropriate thermal treatment of the system (thin film and substrate), according to the thermal analysis of the compound. Surface morphology of the thin films was investigated by atomic force microscopy (AFM) and spectroscopic-ellipsometry (SE) measurements.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2009.02.062Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2009.02.062;
- PII
- S0169-4332(09)00223-2;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 255
- Journal Issue
- 15
- Journal Page Range
- p. 6786-6789
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44009326
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CADMIUM COMPLEXES; CADMIUM SULFIDES; DEPOSITION; ELLIPSOMETRY; EVAPORATION; FOURIER TRANSFORM SPECTROMETERS; HEAT TREATMENTS; INFRARED SPECTRA; LASER RADIATION; LAYERS; SILICON; SUBSTRATES; SURFACES; THERMAL ANALYSIS; THIN FILMS
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; COMPLEXES; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; INORGANIC PHOSPHORS; MEASURING INSTRUMENTS; MEASURING METHODS; MICROSCOPY; PHASE TRANSFORMATIONS; PHOSPHORS; RADIATIONS; SEMIMETALS; SPECTRA; SPECTROMETERS; SULFIDES; SULFUR COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.