Published May 15, 1987
| Version v1
Journal article
Secondary electron emission-capacitive probes for plasma potential measurements in plasmas with hot electrons
Creators
- 1. University of Wisconsin-Madison, Madison, Wisconsin 53706
Description
It is shown that a secondary electron emission-capacitive probe can determine the plasma potential when T/sub e/ ≥50 eV. The probe is wideband (1 Hz to greater than 20 MHz) and relatively simple to operate. The Phaedrus-B tandem mirror plasma where T/sub e/ --40--60 eV and n≅5 x 1012 cm-3 is used to verify this technique
Additional details
Publishing Information
- Journal Title
- J. Appl. Phys.
- Journal Volume
- 61
- Journal Issue
- 10
- Series
- J. Appl. Phys.
- Journal Page Range
- 4786-4790
- ISSN
- 0021-8979
- CODEN
- JAPIA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18063036
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CAPACITANCE; ELECTRIC POTENTIAL; ELECTRON EMISSION; ELECTRON PROBES; PLASMA DIAGNOSTICS; SECONDARY EMISSION; TANDEM MIRRORS
- Descriptors DEC
- ELECTRICAL PROPERTIES; EMISSION; MAGNETIC MIRRORS; OPEN PLASMA DEVICES; PHYSICAL PROPERTIES; PROBES; THERMONUCLEAR DEVICES