Nitriding of titanium by using an ion beam delivered by a plasma focus
- 1. Department of Physics, GC University, 54000 Lahore (Pakistan)
- 2. Salam Chair in Physics, GC University, 54000 Lahore (Pakistan)
- 3. Department of Physics, Quaid-i-Azam University, 45320 Islamabad (Pakistan)
Description
The room temperature nitriding of titanium is accomplished by utilizing nitrogen ion beams delivered by a 2.3 kJ plasma focus discharge. Titanium samples are exposed to ions at different axial positions (3, 5, 7 and 9 cm from the focus) in order to correlate their surface properties with ion beam parameters such as energy, number density, current density and energy flux (energy deliverance per unit time per unit volume). A BPX65 photodiode detector is employed to measure the ion beam parameters by using the time of flight technique. X-ray diffraction analysis as well as field emission scanning electron microscopy along with the energy dispersive x-ray spectroscopy is carried out to explore the structural, morphological and compositional profiles of the treated samples. The results demonstrate the formation of nanocrystalline TiN thin film with surface features strongly dependent on ion beam energy flux. A Vickers microindentation measurement reveals that the surface hardness is improved 4-5 times for typical nitrided samples
Additional details
Identifiers
- DOI
- 10.1088/0022-3727/40/3/013;
- PII
- S0022-3727(07)35392-8;
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 40
- Journal Issue
- 3
- Journal Page Range
- p. 769-777
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38086064
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTALS; CURRENT DENSITY; FIELD EMISSION; HARDNESS; ION BEAMS; NANOSTRUCTURES; NITRIDATION; NITROGEN IONS; PLASMA FOCUS; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TIME-OF-FLIGHT METHOD; TITANIUM; TITANIUM NITRIDES; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; FILMS; IONS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; SCATTERING; SPECTROSCOPY; TEMPERATURE RANGE; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS