Published November 1, 1988 | Version v1
Journal article Metadata-only

Dielectric measurements of selected ceramic materials at 245 GHz

Creators

  • 1. Department of Physics, North Carolina Central University, Durham, North Carolina 27707

Description

A double-beam interferometer which incorporates quasioptical components developed in this laboratory has been used to measure near millimeter-wave dielectric properties of a variety of ceramic materials. We report here the results obtained on samples of various standard and advanced ceramics including alumina, silicon nitride, beryllia, and boron nitride. Results are compared with the data obtained by other researchers on similar samples

Additional details

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
64
Journal Issue
9
Series
J. Appl. Phys.
Journal Page Range
4674-4677
ISSN
0021-8979
CODEN
JAPIA

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
20002050
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALUMINIUM OXIDES; BERYLLIUM OXIDES; BORON NITRIDES; CERAMICS; DIELECTRIC PROPERTIES; FAR INFRARED RADIATION; INTERFEROMETRY; MEASURING METHODS; MICROWAVE RADIATION; OPTICAL PROPERTIES; SILICON NITRIDES
Descriptors DEC
ALKALINE EARTH METAL COMPOUNDS; ALUMINIUM COMPOUNDS; BERYLLIUM COMPOUNDS; BORON COMPOUNDS; CHALCOGENIDES; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; INFRARED RADIATION; NITRIDES; NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SILICON COMPOUNDS