Published December 1992
| Version v1
Journal article
Upgrading energy-dispersive x-ray fluorescence analysis (survey)
Description
Rapid progress in semiconductor detectors in the 1960s led to their general use in analysis. The use of semiconductor detectors in x-ray fluorescence has been considered in books and special surveys. Information on certain aspects of the use of these semiconductor x-ray detectors can be derived from survey papers dealing with general aspects of x-ray fluorescence. In this survey, improving energy-dispersive x-ray spectrometers, including improving the analytical characteristics by monochromatizing and polarizing the exciting radiation is considered. Synchrotron radiation used for analytical purposes is discussed. 180 refs
Additional details
Publishing Information
- Journal Title
- Industrial Laboratory
- Journal Volume
- 58
- Journal Issue
- 6
- Journal Page Range
- p. 496-505.
- ISSN
- 0019-8447
- CODEN
- INDLAP
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 25012907
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Translation
- Descriptors DEI
- MONOCHROMATIC RADIATION; OPTIMIZATION; POLARIZATION; REVIEWS; SEMICONDUCTOR DETECTORS; SENSITIVITY; SYNCHROTRON RADIATION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROMETERS
- Descriptors DEC
- BREMSSTRAHLUNG; CHEMICAL ANALYSIS; DOCUMENT TYPES; ELECTROMAGNETIC RADIATION; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS; RADIATIONS; SPECTROMETERS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- Cover-to-cover Translation of Zavodskaya Laboratoriya (USSR); Translated from Zavodskaya Laboratoriya; 58: No. 6, 12-19(Jun 1992).