Published December 1992 | Version v1
Journal article

Upgrading energy-dispersive x-ray fluorescence analysis (survey)

Creators

  • 1. Earth's Crust Institute, Irkutsk (Russian Federation)

Description

Rapid progress in semiconductor detectors in the 1960s led to their general use in analysis. The use of semiconductor detectors in x-ray fluorescence has been considered in books and special surveys. Information on certain aspects of the use of these semiconductor x-ray detectors can be derived from survey papers dealing with general aspects of x-ray fluorescence. In this survey, improving energy-dispersive x-ray spectrometers, including improving the analytical characteristics by monochromatizing and polarizing the exciting radiation is considered. Synchrotron radiation used for analytical purposes is discussed. 180 refs

Additional details

Publishing Information

Journal Title
Industrial Laboratory
Journal Volume
58
Journal Issue
6
Journal Page Range
p. 496-505.
ISSN
0019-8447
CODEN
INDLAP

Optional Information

Notes
Cover-to-cover Translation of Zavodskaya Laboratoriya (USSR); Translated from Zavodskaya Laboratoriya; 58: No. 6, 12-19(Jun 1992).