Published March 2018 | Version v1
Journal article

Real-time observation of transient chemical reaction by in-situ time-resolved quick XAFS method

Creators

  • 1. Japan Synchrotron Radiation Research Institute (JASRI), Sayo, Hyogo (Japan)

Description

An in-situ time-resolved quick scanning X-ray absorption fine structure (quick XAFS) technique is a powerful tool for investigating the local structure and chemical state of target elements during transient chemical reaction processes. Recently, we developed new beamline at SPring-8 optimized for quick XAFS and realized high quality time-resolved XAFS measurements with millisecond order. In this review, we describe the outline of the measurement systems and beamlines and recent results of electrochemical reaction processes in electrode catalysts in fuel cells. (author)

Abstract (Japanese)

In-situ時間分解クイックXAFS法は,一過性反応のメカニズムを原子レベルで解明する際に非常に強力な手法である.近年,SPring-8でクイックXAFS法に最適化された放射光ビームラインを建設し,ミリ秒オーダーの高質な時間分解XAFS計測法や複合同時時間分解計測法を開発した.本稿では,クイックXAFS計測装置やビームラインの概要および,燃料電池電極触媒の反応過程等に対する応用研究を紹介する.(著者)

Additional details

Additional titles

Original title (Japanese)
In-situ時間分解クイックXAFS法による一過性反応のその場観察

Publishing Information

Journal Title
X-sen Bunseki No Shinpo
Journal Volume
49
Series
雑誌名:X線分析の進歩
Journal Page Range
p. 101-110
ISSN
0911-7806

Optional Information

Notes
10 refs., 11 figs.