Published July 17, 1984 | Version v1
Patent

Diffraction crystal for sagittally focusing x-rays

Description

The invention is a new type of diffraction crystal designed for sagittally focusing photons of various energies. The invention is based on the discovery that such focusing is not obtainable with conventional crystals because of distortion resulting from anticlastic curvature. The new crystal comprises a monocrystalline base having a front face contoured for sagittally focusing photons and a back face provided with rigid, upstanding, stiffening ribs restricting anticlastic curvature. When mounted in a suitable bending device, the reflecting face of the crystal can be adjusted to focus photons having any one of a range of energies

Availability note (English)

U.S. Commissioner of Patents, Washington, D.C. 20231, USA, $.50.

Additional details

Publishing Information

Imprint Pagination
v p.
IPC:
Int. Cl. G01N 23/20.
IPC
Int. Cl. G01N 23/20.
Patent number
US patent document 4,461,018/A/

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
16046745
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
BENDING; CRYSTALLOGRAPHY; CRYSTALS; DIFFRACTION; FOCUSING; MONOCHROMATORS; PHOTONS; REFLECTION; SPECIFICATIONS; X RADIATION; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DEFORMATION; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; IONIZING RADIATIONS; MASSLESS PARTICLES; RADIATIONS; SCATTERING

Optional Information

Notes
PAT-APPL-385993.