Published March 2005 | Version v1
Journal article

An automated method to analyze separately the microtextures of primary αp grains and the secondary αs inherited colonies in bimodal titanium alloys

  • 1. Laboratoire d'Etude des Textures et Applications aux Materiaux, LETAM, CNRS UMR 7078, Universite de Metz, F-57045 Metz Cedex 01 (France)
  • 2. Centre des technologies de fabrication en aerospatiale, Institut de recherche aerospatiale, CNRC, Montreal, Quebec, H3T 2B2 (Canada)
  • 3. Mc Gill University, Montreal, PQ (Canada)

Description

A method was developed to automatically recognize the orientations of primary αp grains and secondary αs colonies of a bimodal titanium alloy, on the orientation map. Both populations of grains are dissociated by correlating the Electron Back Scattering Diffraction data with the corresponding Back Scattered Electron image on which a high chemical contrast is observed between the αp and (αs+βresidual) phases. The whole data processing is successfully applied to a large EBSD map of a bimodal IMI 834 billet. This allows to discuss the contribution of αp grains and αs colonies to the sharp texture heterogeneities observed in the billet

Additional details

Identifiers

DOI
10.1016/j.matchar.2004.11.011;
PII
S1044-5803(04)00277-3;

Publishing Information

Journal Title
Materials Characterization
Journal Volume
54
Journal Issue
3
Journal Page Range
p. 216-222
ISSN
1044-5803
CODEN
MACHEX

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37057325
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BACKSCATTERING; DATA PROCESSING; ELECTRON DIFFRACTION; IMAGE PROCESSING; IMAGES; MICROSTRUCTURE; ORIENTATION; TEXTURE; TITANIUM ALLOYS
Descriptors DEC
ALLOYS; COHERENT SCATTERING; DIFFRACTION; PROCESSING; SCATTERING; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.