Atomic resolution imaging of YAlO3: Ce in the chromatic and spherical aberration corrected PICO electron microscope
- 1. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Jülich-Aachen Research Alliance (JARA), Forschungszentrum Jülich GmbH, 52425 Jülich (Germany)
- 2. Central Facility for Electron Microscopy, RWTH Aachen University, 52074 Aachen (Germany)
- 3. School of Electronic and Information Engineering and State Key Laboratory for Mechanical Behaviour of Materials, Xi'an Jiaotong University, Xi'an 710049 (China)
- 4. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Jülich-Aachen Research Alliance (JARA), Forschungszentrum Jülich GmbH, 52425 Jülich, (Germany)
Description
Highlights: • First time resolution of 57 pm atom separations by HRTEM with 200 keV electrons. • Quantification of the image spread by absolute matching of experiment and simulation. • An information limit of 52 pm is deduced from the determined image spread. • Substantial deviations from the bulk structure are observed for the ultra-thin sample. - Abstract: The application of combined chromatic and spherical aberration correction in high-resolution transmission electron microscopy enables a significant improvement of the spatial resolution down to 50 pm. We demonstrate that such a resolution can be achieved in practice at 200 kV. Diffractograms of images of gold nanoparticles on amorphous carbon demonstrate corresponding information transfer. The Y atom pairs in [010] oriented yttrium orthoaluminate are successfully imaged together with the Al and the O atoms. Although the 57 pm pair separation is well demonstrated separations between 55 pm and 80 pm are measured. This observation is tentatively attributed to structural relaxations and surface reconstruction in the very thin samples used. Quantification of the resolution limiting effective image spread is achieved based on an absolute match between experimental and simulated image intensity distributions.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2016.12.026Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2016.12.026;
- PII
- S0304-3991(17)30047-5;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 176
- Journal Page Range
- p. 99-104
- ISSN
- 0304-3991
- CODEN
- ULTRD6
Conference
- Title
- 4. conference on frontiers of aberration corrected electron microscopy
- Acronym
- PICO 2017
- Dates
- 30 Apr - 4 May 2017
- Place
- Kasteel Vaalsbroek (Netherlands)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48086019
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMS; CARBON; ELECTRON MICROSCOPES; ELECTRONS; GEOMETRICAL ABERRATIONS; GOLD; IMAGES; KEV RANGE 100-1000; NANOPARTICLES; SIMULATION; SPATIAL RESOLUTION; SPHERICAL CONFIGURATION; SURFACES; TIME RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM
- Descriptors DEC
- CONFIGURATION; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; KEV RANGE; LEPTONS; METALS; MICROSCOPES; MICROSCOPY; NONMETALS; PARTICLES; RESOLUTION; TIMING PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.