Performance of beamline X8C at the NSLS
- 1. Argonne Nat. Lab., Upton, NY (United States). Nat. Synchrotron Light Source
- 2. Los Alamos National Laboratory/SFA, National Synchrotron Light Source, Building 725/X8, Upton, NY 11973 (United States)
- 3. Los Alamos National Laboratory, P.O. Box 1663, Mail Stop D410, Los Alamos NM, 87545 (United States)
- 4. Brookhaven National Laboratory, National Synchrotron Light Source, Building 725, Upton, NY 11973 (United States)
Description
Performance characteristics of beamline X8C at the National Synchrotron Light Source are described. Beamline optics consist of a rhodium coated collimating mirror, a two (optional four) crystal monochromator and a rhodium coated focussing mirror. X-ray source diagnostic information is provided by a dual wire beam position monitor that precedes all beamline components. Measurements are presented for three different optical configurations using the non-dispersive two crystal geometry. Advantages and disadvantages of this beamline design are discussed, with particular emphasis placed on details of the collimating mirror performance. A brief description of experimental apparatus is also given including computing resources, which have been optimized to handle biological macromolecular diffraction data from a CCD area detector. ((orig.))
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 352
- Journal Issue
- 3
- Journal Page Range
- p. 535-541.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 26037681
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- APERTURES; BEAM MONITORS; BEAM OPTICS; BEAM POSITION; BEAM TRANSPORT; BRAGG REFLECTION; CHARGE-COUPLED DEVICES; COMPUTERS; CRYSTALS; ENERGY DEPENDENCE; ENERGY RESOLUTION; ENERGY SPECTRA; FCC LATTICES; HARD X RADIATION; HARMONICS; KEV RANGE 01-10; KEV RANGE 10-100; MIRRORS; MONOCHROMATORS; NSLS; OPTIMIZATION; PHOTON BEAMS; POSITION SENSITIVE DETECTORS; RADIATION FLUX; RHODIUM; SEMICONDUCTOR DETECTORS; SILICON; SOFT X RADIATION; SYNCHROTRON RADIATION; X-RAY DETECTION; X-RAY DIFFRACTION; X-RAY SOURCES; X-RAY SPECTRA
- Descriptors DEC
- BEAMS; BREMSSTRAHLUNG; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; DETECTION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; IONIZING RADIATIONS; KEV RANGE; MEASURING INSTRUMENTS; METALS; MONITORS; OPENINGS; OSCILLATIONS; PLATINUM METALS; RADIATION DETECTION; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; REFLECTION; RESOLUTION; SCATTERING; SEMICONDUCTOR DEVICES; SEMIMETALS; SPECTRA; SYNCHROTRON RADIATION SOURCES; TRANSITION ELEMENTS; X RADIATION