Published 1988 | Version v1
Book Metadata-only

Thermal wave inspection employing the infrared detection technique

Creators

Description

Thermal wave inspection is introduced with particular reference to the measurement and testing of surface coatings. Measurements are presented which demonstrate the effectiveness of the technique for assessing the thickness of plasma sprayed coatings and for detecting and imaging subsurface defects. A new miniaturized testing system employing a high power semiconductor laser and a high collection efficiency infrared detector is described. 5 references

Additional details

Publishing Information

Publisher
Society of Photo-Optical Instrumentation Engineers.
Imprint Place
Bellingham, WA (USA)
Imprint Title
Recent developments and applications of infrared analytical instrumentation; Proceedings of the Meeting, London, England, June 7, 8, 1988
Journal Page Range
p. 84-90.

Conference

Title
design and testing.
Acronym
Infrared systems
Dates
9-10 Jun 1988.
Place
London (UK).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
20042665
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ENERGY DEPOSITION; INFRARED RADIATION; INSPECTION; LASERS; NONDESTRUCTIVE TESTING; PLASMA ARC SPRAYING; RADIATION DETECTORS; SEMICONDUCTOR LASERS; SPRAYED COATINGS; THICKNESS; USES
Descriptors DEC
AMPLIFIERS; COATINGS; DEPOSITION; DIMENSIONS; ELECTROMAGNETIC RADIATION; EQUIPMENT; MATERIALS TESTING; MEASURING INSTRUMENTS; RADIATIONS; SEMICONDUCTOR DEVICES; SOLID STATE LASERS; SPRAY COATING; SURFACE COATING; TESTING