Published November 2004
| Version v1
Journal article
Local Structure of Implicated Pd in Si Using PAC
- 1. Australian National University, Department of Electronic Materials Engineering, Research School of Physical Sciences and Engineering (Australia)
- 2. ANU, Department of Nuclear Physics, RSPhysSE (Australia)
- 3. Universitaet Bonn, Institut fuer Strahlen- und Kernphysik (Germany)
Description
TDPAC has been employed to study the local structure of implanted palladium in silicon utilizing 87-75 keV γ-γ cascade of probe nucleus 100Pd. The observed hyperfine parameters revealed the presence of Pd-V defect pair only in highly doped n-type silicon. A dumbbell structure with substitutional palladium and silicon vacancy as nearest neigbor is suggested for this defect.
Additional details
Identifiers
Publishing Information
- Journal Title
- Hyperfine Interactions
- Journal Volume
- 158
- Journal Issue
- 1-4
- Journal Page Range
- p. 299-303
- ISSN
- 0304-3843
- CODEN
- HYINDN
Conference
- Title
- 13. international conference on hyperfine interactions; 17. international symposium on nuclear quadrupole interactions
- Acronym
- HFI/NQI 2004
- Dates
- 22-27 Aug 2004
- Place
- Bonn (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43027804
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL DEFECTS; DOPED MATERIALS; HYPERFINE STRUCTURE; ION IMPLANTATION; KEV RANGE 10-100; PALLADIUM 100; PALLADIUM ADDITIONS; PERTURBED ANGULAR CORRELATION; PROBES; SILICON; VACANCIES
- Descriptors DEC
- ANGULAR CORRELATION; BETA DECAY RADIOISOTOPES; CORRELATIONS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DAYS LIVING RADIOISOTOPES; ELECTRON CAPTURE RADIOISOTOPES; ELEMENTS; ENERGY RANGE; EVEN-EVEN NUCLEI; INTERMEDIATE MASS NUCLEI; ISOTOPES; KEV RANGE; MATERIALS; NUCLEI; PALLADIUM ISOTOPES; POINT DEFECTS; RADIOISOTOPES; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2004 Springer Science+Business Media, Inc.