Published October 2004
| Version v1
Journal article
High-bias conductance of atom-sized Cu contacts
Description
We have measured the conductance of Cu nanocontacts for biases Vb=0.1-0.8 V and investigated the bias dependence of the formation probability pCu of Cu single-atom contacts (SACs). We found that pCu decreases with increasing Vb and vanishes at a critical bias Vbc ∼0.7 V, contrary to Vbc ∼2.3 V for pAu of Au SACs. Both pCu and pAu, however, show the same bias dependence when plotted against the reduced bias Vb/Vbc
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2004.06.033;
- PII
- S0040609004007710;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 464-465
- Journal Issue
- 1-2
- Journal Page Range
- p. 251-254
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 7. international symposium on atomically controlled surfaces, interfaces and nanostructures
- Dates
- 16-20 Nov 2003
- Place
- Nara (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36079178
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMS; COPPER; ELECTRIC CONDUCTIVITY; NANOSTRUCTURES; PROBABILITY
- Descriptors DEC
- ELECTRICAL PROPERTIES; ELEMENTS; METALS; PHYSICAL PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.