Published October 2004 | Version v1
Journal article

High-bias conductance of atom-sized Cu contacts

Description

We have measured the conductance of Cu nanocontacts for biases Vb=0.1-0.8 V and investigated the bias dependence of the formation probability pCu of Cu single-atom contacts (SACs). We found that pCu decreases with increasing Vb and vanishes at a critical bias Vbc ∼0.7 V, contrary to Vbc ∼2.3 V for pAu of Au SACs. Both pCu and pAu, however, show the same bias dependence when plotted against the reduced bias Vb/Vbc

Additional details

Identifiers

DOI
10.1016/j.tsf.2004.06.033;
PII
S0040609004007710;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
464-465
Journal Issue
1-2
Journal Page Range
p. 251-254
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
7. international symposium on atomically controlled surfaces, interfaces and nanostructures
Dates
16-20 Nov 2003
Place
Nara (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36079178
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMS; COPPER; ELECTRIC CONDUCTIVITY; NANOSTRUCTURES; PROBABILITY
Descriptors DEC
ELECTRICAL PROPERTIES; ELEMENTS; METALS; PHYSICAL PROPERTIES; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.