Published April 24, 2014 | Version v1
Journal article

Cleaning of optical surfaces by capacitively coupled RF discharge plasma

  • 1. X-ray Optics Section, Indus Synchrotron Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore- 452013 (India)
  • 2. Laser Plasma Laboratory, Laser Plasma Division Raja Ramanna Centre for Advanced Technology, Indore- 452013 (India)
  • 3. Mechanical and Optical Support Section, Raja Ramanna Centre for Advanced Technology, Indore- 452013 (India)

Description

In this paper, we report cleaning of carbon capped molybdenum (Mo) thin film by in-house developed radio frequency (RF) plasma reactor, at different powers and exposure time. Carbon capped Mo films were exposed to oxygen plasma for different durations at three different power settings, at a constant pressure. After each exposure, the thickness of the carbon layer and the roughness of the film were determined by hard x-ray reflectivity measurements. It was observed that most of the carbon film got removed in first 15 minutes exposure. A high density layer formed on top of the Mo film was also observed and it was noted that this layer cannot be removed by successive exposures at different powers. A significant improvement in interface roughness with a slight improvement in top film roughness was observed. The surface roughness of the exposed and unexposed samples was also confirmed by atomic force microscopy measurements

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1591
Journal Issue
1
Journal Page Range
p. 890-892
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
58. DAE solid state physics symposium 2013
Dates
17-21 Dec 2013
Place
Patiala, Punjab (India)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45092284
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CARBON; CLEANING; HARD X RADIATION; INTERFACES; LAYERS; MOLYBDENUM; PLASMA; RADIOWAVE RADIATION; REFLECTIVITY; ROUGHNESS; SURFACES; THIN FILMS
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IONIZING RADIATIONS; METALS; MICROSCOPY; NONMETALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; REFRACTORY METALS; SURFACE PROPERTIES; TRANSITION ELEMENTS; X RADIATION

Optional Information

Notes
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