Obtention of CoFe2O4 thin film by sol-gel method
Creators
- 1. Universidade Federal de Pernambuco (UFPE), PE (Brazil)
Description
Full text: This work is based on fabrication and characterization magnetic and structurally of CoFe2O4 (CFO) thin films obtained by sol-gel method. Thin films of different thicknesses were obtained on a silicon substrate (Si (100)) using the technique of spin coating. The crystallinity of all the samples obtained was confirmed by X-ray diffraction (XRD). All phases obtained correspond to CoFe2O4. The lattice parameters were determined by Rietveld method, and are in agreement with those reported in the literature. The scanning electron microscopy (SEM) showed thin films with good homogeneity and it was possible to determine its thickness. The magnetic properties were measured using vibrating sample magnetometry (VSM). The field applied during measurement was oriented parallel to the film plane and there was a high coercivity, as well as a characteristic behavior of a material hard magnetically [1-3]. (author)
Availability note (English)
Available in abstract form only; full text entered in this recordAdditional details
Publishing Information
- Imprint Pagination
- 1 p.
Conference
- Title
- 14. Brazil MRS meeting
- Dates
- 27 Sep - 1 Oct 2015
- Place
- Rio de Janeiro, RJ (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 49077047
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- COBALT OXIDES; IRON OXIDES; LATTICE PARAMETERS; MAGNETIC PROPERTIES; SCANNING ELECTRON MICROSCOPY; SILICON; SOL-GEL PROCESS; SPIN-ON COATING; THICKNESS; THIN FILMS; VIBRATING SAMPLE MAGNETOMETERS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COBALT COMPOUNDS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTS; FILMS; IRON COMPOUNDS; MAGNETOMETERS; MEASURING INSTRUMENTS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SEMIMETALS; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS