Published October 30, 1973
| Version v1
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MOSFET detector evaluation
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.Files
5110729.pdf
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(265.6 kB)
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Additional details
Additional titles
- Augmented title (English)
- Evaluation of MOSFET detectors for x-ray dosimetry
Publishing Information
- Imprint Pagination
- 7 p.
- Report number
- UCRL--74796
Conference
- Title
- Nuclear science symposium.
- Dates
- 14 Nov 1973.
- Place
- San Francisco, California, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 5110729
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DOSEMETERS; MOSFET; PHYSICAL RADIATION EFFECTS; READOUT SYSTEMS; SENSITIVITY; X-RAY DOSIMETRY
- Descriptors DEC
- DOSIMETRY; MEASURING INSTRUMENTS; MOS TRANSISTORS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; TRANSISTORS
Optional Information
- Secondary number(s)
- CONF-731112--3.