Published 1990
| Version v1
Miscellaneous
The influence of atomic number on the sensitivity of xrf analysis with the use of various crystals
Creators
Description
Short note. 1 fig
Additional details
Additional titles
- Augmented title (English)
- Elements: B, C, O, F, Na, Mg, Al, Si
Publishing Information
- Imprint Title
- 11. Conference on analytical atomic spectroscopy with International participation
- Imprint Pagination
- 480 p.
- Journal Page Range
- p. 377.
- Report number
- INIS-SU--275
Conference
- Title
- 11. Conference on analytical atomic spectroscopy.
- Dates
- 29 Jul - 4 Aug 1990.
- Place
- Moscow (USSR).
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 22075400
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ATOMIC NUMBER; CRYSTALS; ELEMENTS; SENSITIVITY; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS