High temperature image correction in DIC measurement due to thermal radiation

In this article, the basic principle of high temperature image correction due to thermal radiation and its application in DIC high temperature measurement are investigated. First, the basic principle of high temperature image and the image gray level model due to thermal radiation are analyzed. Second, the high temperature image correction method in DIC measurement is proposed and the relationship between the gray level of high temperature image and the thermal radiation is established. Finally, the simulated high temperature image is corrected to validate the effectiveness of eliminating the thermal radiation effect in high temperature DIC, and a high temperature DIC experiment using a SiC specimen is performed to extract the high temperature displacement with high accuracy. (paper)