Published June 1996
| Version v1
Journal article
X-ray microprobes
- 1. LPAN, Universite Paris VI, 75 252 Paris Cedex (France)
- 2. Paris-11 Univ., 91 - Orsay (France). Lab. pour l'Utilisation du Rayonnement Electromagnetique (LURE)
- 3. LSAI, Universite Paris-Sud, Bat. 350, 91405 Orsay Cedex (France)
- 4. IMT RAS, Laboratory of X-ray Optics and Technology Chernogolovka, Moscow (Russian Federation)
- 5. CEA Bruyeres le Chatel, BP 12, 91680 Bruyeres le Chatel (France)
Description
The advent of synchrotron radiation and the recent development of X-ray optics have rendered possible the realization of X-ray fluorescence microprobes. Various arrangements allow to obtain micrometer size hard X-ray beams with enough flux to undertake elemental mapping of trace elements. Associated with microdiffraction or with extended X-ray absorption fine structure studies, these microprobes will become a very interesting tool for material characterization. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 113
- Journal Issue
- 1-4
- Journal Page Range
- p. 122-127.
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 4. European conference on accelerators in applied research and technology (ECAART-4).
- Dates
- 29 Aug - 2 Sep 1995.
- Place
- Zurich (Switzerland).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 27064820
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARSENIC; BRAGG REFLECTION; CHROMIUM; COPPER; GALLIUM; HARD X RADIATION; IRON; MANGANESE; NICKEL; PHOTON BEAMS; PROBES; SENSITIVITY; SPATIAL RESOLUTION; SYNCHROTRON RADIATION; TITANIUM; TRACE AMOUNTS; VANADIUM; X-RAY DIFFRACTION; X-RAY EQUIPMENT; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROSCOPY; ZINC
- Descriptors DEC
- BEAMS; BREMSSTRAHLUNG; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; EQUIPMENT; IONIZING RADIATIONS; METALS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; REFLECTION; RESOLUTION; SCATTERING; SEMIMETALS; SPECTROSCOPY; TRANSITION ELEMENTS; X RADIATION; X-RAY EMISSION ANALYSIS