Published July 2013
| Version v1
Journal article
Study of fullerene films on silicon substrates properties
Description
Measured optical absorption and photoluminescence structures in which fullerene films deposited by hot wall method. Optical constants of fullerene films were determined by multiangle ellipsometry. Measured absorption spectra contain characteristics fullerene frequencies,indicating to high structural perfection and optical films, and absence of molecules destruction during hot wall deposition
Additional details
Additional titles
- Original title (Ukrainian)
- Vivchennya vlastivostej fulerenovikh plyivok na kremnyijevyij pyidkladtsyi
Publishing Information
- Journal Title
- Vyisnik Kiyivs'kogo Unyiversitetu. Fyiziko-Matematichnyi Nauki
- Journal Issue
- no.3
- Series
- ISBN 978-617-571-036-4
- Journal Page Range
- p. 347-350
- ISSN
- 1812-5409
INIS
- Country of Publication
- Ukraine
- Country of Input or Organization
- Ukraine
- INIS RN
- 45100914
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ABSORPTION; FILMS; FULLERENES; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SILICON; SPECTRA; SUBSTRATES
- Descriptors DEC
- CARBON; ELEMENTS; EMISSION; LUMINESCENCE; NONMETALS; PHOTON EMISSION; PHYSICAL PROPERTIES; SEMIMETALS; SORPTION