Published November 18, 2002
| Version v1
Journal article
Interferometric probing of thin Niobium layers under high electrical field using the zinc X-ray laser at PALS
Creators
- 1. Department of Gas Lasers/PALS Research Center, Institute of Physics, Na Slovance 2, Prague 8 (Czech Republic)
- 2. Laboratoire de Spectroscopie Atomique et Ionique (LSAI), Batiment 350, Universite Paris-Sud, 91405 Orsay (France)
- 3. Institut d'Optique Theorique et Appliquee, Laboratoire Charles Fabry, Batiment 503, Universite Paris-Sud, 91403 Orsay (France)
- 4. Commisariat a l'Energie Atomique (CEA), Saclay, 91191 Gif-sur-Yvette (France)
Description
We report on interferometric investigation of perturbed surfaces under high electric field by using the 21.2 nm zinc soft X-ray laser operating in a half cavity configuration. DC electric fields of up to 100 MV/m were applied to the surface of a niobium sample. Both positive and negative polarizations of the electric field were examined. Single shot, high-quality X-ray interferograms were recorded with a double-mirror Fresnel interferometer and surface maps were obtained from the experimental data by holographic reconstruction
Additional details
Identifiers
- DOI
- 10.1063/1.1521070;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 641
- Journal Issue
- 1
- Journal Page Range
- p. 518-521
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 8. international conference on X-ray lasers
- Dates
- 27-31 May 2002
- Place
- Aspen, CO (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35090952
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CAVITIES; ELECTRIC FIELDS; EXPERIMENTAL DATA; HOLOGRAPHY; IMAGE PROCESSING; INTERFEROMETERS; INTERFEROMETRY; LAYERS; MIRRORS; NIOBIUM; POLARIZATION; SOFT X RADIATION; SURFACES; X-RAY LASERS; ZINC
- Descriptors DEC
- DATA; ELECTROMAGNETIC RADIATION; ELEMENTS; INFORMATION; IONIZING RADIATIONS; LASERS; MEASURING INSTRUMENTS; METALS; NUMERICAL DATA; PROCESSING; RADIATIONS; REFRACTORY METALS; TRANSITION ELEMENTS; X RADIATION
Optional Information
- Notes
- (c) 2002 American Institute of Physics