Electron attenuation in free, neutral ethane clusters
Creators
- 1. Department of Chemistry, University of Bergen, NO-5007 Bergen (Norway)
- 2. Department of Physics and Technology, University of Bergen, NO-5007 Bergen (Norway)
Description
The electron effective attenuation length (EAL) in free, neutral ethane clusters has been determined at 40 eV kinetic energy by combining carbon 1s x-ray photoelectron spectroscopy and theoretical lineshape modeling. More specifically, theory is employed to form model spectra on a grid in cluster size (N) and EAL (λ), allowing N and λ to be determined by optimizing the goodness-of-fit χ2(N, λ) between model and observed spectra. Experimentally, the clusters were produced in an adiabatic-expansion setup using helium as the driving gas, spanning a range of 100–600 molecules in mean cluster size. The effective attenuation length was determined to be 8.4 ± 1.9 Å, in good agreement with an independent estimate of 10 Å formed on the basis of molecular electron-scattering data and Monte Carlo simulations. The aggregation state of the clusters as well as the cluster temperature and its importance to the derived EAL value are discussed in some depth
Additional details
Identifiers
- DOI
- 10.1063/1.4898369;
Publishing Information
- Journal Title
- Journal of Chemical Physics
- Journal Volume
- 141
- Journal Issue
- 16
- Journal Page Range
- p. 164305-164305.9
- ISSN
- 0021-9606
- CODEN
- JCPSA6
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46016920
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- AGGLOMERATION; COMPUTERIZED SIMULATION; ELECTRONS; ETHANE; GRIDS; KINETIC ENERGY; MOLECULES; MONTE CARLO METHOD; SCATTERING; SPECTRA; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALKANES; CALCULATION METHODS; ELECTRODES; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ENERGY; FERMIONS; HYDROCARBONS; LEPTONS; ORGANIC COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SIMULATION; SPECTROSCOPY
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC