Published November 1, 2008 | Version v1
Journal article

Three-dimensional imaging using computer-generated holograms synthesized from 3-D Fourier spectra

  • 1. University of Tsukba, Institute of Applied Physics, Tennoudai 1-1-1, Tsukuba, Ibaraki 305-8571 (Japan)

Description

Computer-generated holograms(CGHs) synthesized from projection images of real existing objects are considered. A series of projection images are recorded both vertically and horizontally with an incoherent light source and a color CCD. According to the principles of computer tomography(CT), the 3-D Fourier spectrum is calculated from several projection images of objects and the Fresnel CGH is synthesized using a part of the 3-D Fourier spectrum. This method has following advantages. At first, no-blur reconstructed images in any direction are obtained owing to two-dimensionally scanning in recording. Secondarily, since not interference fringes but simple projection images of objects are recorded, a coherent light source is not necessary. Moreover, when a color CCD is used in recording, it is easily possible to record and reconstruct colorful objects. Finally, we demonstrate reconstruction of biological objects.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/139/1/012005

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
139
Journal Issue
1
Journal Page Range
[7 p.]
ISSN
1742-6596

Conference

Title
7. international workshop on information optics
Acronym
WIO-08
Dates
1-5 Jun 2008
Place
Annecy (France)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41050527
Subject category
S62: RADIOLOGY AND NUCLEAR MEDICINE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE-COUPLED DEVICES; COLOR; COMPUTERIZED TOMOGRAPHY; DIMENSIONS; FOURIER ANALYSIS; HOLOGRAPHY; IMAGE PROCESSING; IMAGES; INTERFERENCE; LIGHT SOURCES
Descriptors DEC
DIAGNOSTIC TECHNIQUES; OPTICAL PROPERTIES; ORGANOLEPTIC PROPERTIES; PHYSICAL PROPERTIES; PROCESSING; RADIATION SOURCES; SEMICONDUCTOR DEVICES; TOMOGRAPHY