Published November 15, 2013
| Version v1
Journal article
Irradiation of ionic liquid ion beams on silicon and glass substrates
Description
Irradiation of an ionic liquid 1-butyl-3-methylimidazolium hexafluorophosphate (BMIM-PF6) ion beam on borosilicate glass and single crystalline Si(100) surface was demonstrated by using an ionic liquid ion source we developed. Surface smoothing on the glass substrates was produced by the irradiations at an acceleration voltage of 4 kV with both positive and negative ion beams, which include cation–anion pairs attached to a single ion of either polarity. Water contact angle measurements and X-ray photoelectron spectroscopy indicated that the surface smoothing was probably caused by surface modification involving nano-ordered chemical etching by Si–F reaction, implantation and deposition of P, N and C
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2013.04.074Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2013.04.074;
- PII
- S0168-583X(13)00658-7;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 315
- Journal Page Range
- p. 234-239
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 25. international conference on atomic collisions in solids
- Acronym
- ICACS-25
- Dates
- 21-25 Oct 2012
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45067568
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATION; ANIONS; BOROSILICATE GLASS; DEPOSITION; ETCHING; ION BEAMS; ION SOURCES; IRRADIATION; LIQUIDS; MOLTEN SALTS; MONOCRYSTALS; SILICON; SUBSTRATES; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CRYSTALS; ELECTRON SPECTROSCOPY; ELEMENTS; FLUIDS; GLASS; IONS; PHOTOELECTRON SPECTROSCOPY; SALTS; SEMIMETALS; SPECTROSCOPY; SURFACE FINISHING
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.