Published November 15, 2013 | Version v1
Journal article

Irradiation of ionic liquid ion beams on silicon and glass substrates

Description

Irradiation of an ionic liquid 1-butyl-3-methylimidazolium hexafluorophosphate (BMIM-PF6) ion beam on borosilicate glass and single crystalline Si(100) surface was demonstrated by using an ionic liquid ion source we developed. Surface smoothing on the glass substrates was produced by the irradiations at an acceleration voltage of 4 kV with both positive and negative ion beams, which include cation–anion pairs attached to a single ion of either polarity. Water contact angle measurements and X-ray photoelectron spectroscopy indicated that the surface smoothing was probably caused by surface modification involving nano-ordered chemical etching by Si–F reaction, implantation and deposition of P, N and C

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2013.04.074

Additional details

Identifiers

DOI
10.1016/j.nimb.2013.04.074;
PII
S0168-583X(13)00658-7;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
315
Journal Page Range
p. 234-239
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
25. international conference on atomic collisions in solids
Acronym
ICACS-25
Dates
21-25 Oct 2012
Place
Kyoto (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45067568
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCELERATION; ANIONS; BOROSILICATE GLASS; DEPOSITION; ETCHING; ION BEAMS; ION SOURCES; IRRADIATION; LIQUIDS; MOLTEN SALTS; MONOCRYSTALS; SILICON; SUBSTRATES; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
BEAMS; CHARGED PARTICLES; CRYSTALS; ELECTRON SPECTROSCOPY; ELEMENTS; FLUIDS; GLASS; IONS; PHOTOELECTRON SPECTROSCOPY; SALTS; SEMIMETALS; SPECTROSCOPY; SURFACE FINISHING

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.