Published December 1, 2008 | Version v1
Journal article

Characterization of erbium chloride seeded gallium nitride nanocrystals

  • 1. Department of Chemical and Biological Engineering, Korea University, Seoul (Korea, Republic of)
  • 2. U.S. Naval Research Laboratory, Electronics Science and Technology Division, 4555 Overlook Ave., SW, Washington, DC 20375 (United States)

Description

A novel erbium chloride seeded growth process was developed for the growth and fabrication of erbium doped GaN nanocrystals. This erbium chloride seeded technique simplifies the delivery of erbium into a metal organic chemical vapor deposition system. Additionally, this selective growth of the GaN nanocrystal only occurred in the presence of the ErCl3 seed. Strong green emission, distinctive of the Er3+ ion, was observed in the GaN nanocrystals

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2008.08.170

Additional details

Identifiers

DOI
10.1016/j.tsf.2008.08.170;
PII
S0040-6090(08)00999-1;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
517
Journal Issue
3
Journal Page Range
p. 1111-1114
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
35. international conference on metallurgical coatings and thin films (ICMCTF)
Dates
28 Apr - 2 May 2008
Place
San Diego, CA (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40061707
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; DOPED MATERIALS; ERBIUM CHLORIDES; ERBIUM IONS; FABRICATION; GALLIUM NITRIDES; NANOSTRUCTURES; ORGANOMETALLIC COMPOUNDS
Descriptors DEC
CHARGED PARTICLES; CHEMICAL COATING; CHLORIDES; CHLORINE COMPOUNDS; DEPOSITION; ERBIUM COMPOUNDS; GALLIUM COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; IONS; MATERIALS; NITRIDES; NITROGEN COMPOUNDS; ORGANIC COMPOUNDS; PNICTIDES; RARE EARTH COMPOUNDS; SURFACE COATING

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.