Characterization of low losses in optical thin films and materials
Description
Residual absorption in optical coatings and materials is directly measured by means of the laser-induced deflection (LID) technique. For transmissive coatings a measurement strategy is introduced that allows for the separation of different absorptions of the investigated sample (bulk, coating, surface) by use of only one sample. Laser irradiation yields absorption values between 2x10-3 and 2.9x10-2 for antireflecting and highly reflecting (HR) coatings at 193 nm and 30.6x10-6 for a HR mirror at 527 nm. Use of laser-induced fluorescence at 193 nm excitation reveals trivalent cerium and prasodymium and hydrocarbons in different single layers and coatings. In addition to correlation with absorption data, the influence of a high fluorescence quantum yield on the absorption measurement is discussed
Additional details
Identifiers
- DOI
- 10.1364/AO.47.00C135;
Publishing Information
- Journal Title
- Applied Optics
- Journal Volume
- 47
- Journal Issue
- 13
- Journal Page Range
- p. C135-C142
- ISSN
- 0003-6935
- CODEN
- APOPAI
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40003252
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; CERIUM; COATINGS; EXCITATION; FLUORESCENCE; HYDROCARBONS; LASER RADIATION; LASERS; LAYERS; THIN FILMS
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; ENERGY-LEVEL TRANSITIONS; FILMS; LUMINESCENCE; METALS; ORGANIC COMPOUNDS; PHOTON EMISSION; RADIATIONS; RARE EARTHS; SORPTION
Optional Information
- Notes
- (c) 2008 Optical Society of America