Published November 1993
| Version v1
Journal article
Scanning tunneling microscopy
Description
A brief review of the state-of-the-art of scanning tunneling microscopy (STM) is presented with emphasis on materials problems. I shall discuss in particular the variety of materials, environments and temperatures that can be investigated. In addition to topographic studies, some examples of STM as local probe are given. It is proposed that STM be increasingly incorporated as a technique for investigation of real materials problems. (orig.)
Additional details
Publishing Information
- Journal Title
- Journal de Physique. 4
- Journal Volume
- 3
- Journal Issue
- 7,pt.1
- Journal Page Range
- p. 41-48.
- ISSN
- 1155-4339
- CODEN
- JPICEI
Conference
- Title
- 3. European conference on advanced materials and processes (EUROMAT-3).
- Original Conference Title
- 3. Conference Europeenne sur les Materiaux et les Procedes Avances
- Dates
- 08-10 Jun 1993.
- Place
- Paris (France).
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 25052478
- Subject category
- S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTROCHEMISTRY; ELECTRON MICROSCOPY; FULLERENES; HIGH-TC SUPERCONDUCTORS; MATERIALS TESTING; OXIDES; POROUS MATERIALS; REVIEWS; SPATIAL RESOLUTION; TEMPERATURE DEPENDENCE; TOPOGRAPHY; TUNNEL EFFECT
- Descriptors DEC
- CARBON; CHALCOGENIDES; DOCUMENT TYPES; ELEMENTS; MATERIALS; MICROSCOPY; NONMETALS; OXYGEN COMPOUNDS; RESOLUTION; SUPERCONDUCTORS; TESTING