X-ray study of lattice parameters and thermal expansion of GdRh2Si2 at elevated temperatures

GdRh2Si2 is a rare earth inter metallic compound crystallizes in the body-centered tetragonal ThCr2Si2 - type structure with space group 14/mmm. It has been prepared by melting high purity Gd, Rh and Si elements in an induction furnace. They were annealed in an argon-filled quartz tube at 800 deg C. Single phase nature of the compound was confirmed by X-ray diffraction analysis. Accurate lattice parameters a and c were determined in the temperature range from 301 to 1173 K. It has been found that the lattice parameter a and c at room temperature are found to be 0.40451 and 0.99803 nm respectively and found to increase with temperature. The coefficient of thermal expansion □a and □c were determined and found to be 6.7x10-6K-1 and 2.90x10-6 K-1 and found to be constant throughout the temperature range. (author)