Published February 2008 | Version v1
Journal article

Reliability analysis of shuffle-exchange network systems

  • 1. Department of Mechanical and Production Engineering, Auckland University of Technology, Auckland (New Zealand)

Description

Shuffle-exchange networks (SENs) have been widely considered as practical interconnection systems due to their size of its switching elements (SEs) and uncomplicated configuration. SEN is a network among a large class of topologically equivalent multistage interconnection networks (MINs) that includes omega, indirect binary n-cube, baseline, and generalized cube. In this paper, SEN with additional stages that provide more redundant paths are analyzed. A common network topology with a 2x2 basic building block in a SEN and its variants in terms of extra-stages is investigated. As an illustration, three types of SENs are compared: SEN, SEN with an additional stage (SEN+), and SEN with two additional stages (SEN+2). Finally, three measures of reliability: terminal, broadcast, and network reliability for the three SEN systems are analyzed

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ress.2006.10.027

Additional details

Identifiers

DOI
10.1016/j.ress.2006.10.027;
PII
S0951-8320(07)00045-2;

Publishing Information

Journal Title
Reliability Engineering and System Safety
Journal Volume
93
Journal Issue
2
Journal Page Range
p. 271-276
ISSN
0951-8320
CODEN
RESSEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39065477
Subject category
S42: ENGINEERING;
Descriptors DEI
CONFIGURATION; NETWORK ANALYSIS; RELIABILITY; SAFETY ENGINEERING; TOPOLOGY
Descriptors DEC
ENGINEERING; MATHEMATICS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.