Computerized tomography using high resolution X-ray imaging system with a microfocus source
- 1. Institute of Electrical Engineering, Slovak Academy of Sciences, 92101 Piestany (Slovakia)
- 2. Alexander Dubcek University of Trencin, 91150 Trencin (Slovakia)
- 3. Institute of Nuclear Physics, Polish Academy of Sciences, 31-342 Krakow (Poland)
Description
In recent years there is an effort to image an internal structure of an object by using not only conventional 2D X-ray radiography but also using high resolution 3D tomography which is based on reconstruction of multiple 2D projections at various angular positions of the object. We have previously reported [1] the development and basic parameters of a high resolution x-ray imaging system with a microfocus source. We report the recent progress using this high resolution X-ray laboratory system in this work. These first findings show that our system is particularly suitable for light weight and nonmetallic objects such as biological objects, plastics, wood, paper, etc. where phase contrast helps to increase the visibility of the finest structures of the object. Phase-contrast X-ray Computerized Tomography is of our special interest because it is an emerging imaging technique that can be implemented at third generation synchrotron radiation sources and also in laboratory conditions using a microfocus X-ray tube or beam conditioning optics. (authors)
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Additional details
Identifiers
Publishing Information
- Publisher
- University of Zilina
- Imprint Place
- Zilina (Slovakia)
- ISBN
- 978-80-554-0386-1
- Imprint Title
- Proceedings 17. International Conference on Applied Physics of Condensed Matter
- Imprint Pagination
- 328 p.
- Journal Page Range
- p. 208-211
- Report number
- INIS-SK--2016-043
Conference
- Title
- 17. International Conference on Applied Physics of Condensed Matter
- Acronym
- APCOM 2011
- Dates
- 22-24 Jun 2011
- Place
- High Tatras (Slovakia)
INIS
- Country of Publication
- Slovakia
- Country of Input or Organization
- Slovakia
- INIS RN
- 47127126
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ALUMINIUM BASE ALLOYS; COPPER ALLOYS; CRYSTAL DEFECTS; EQUIPMENT; EXPERIMENTAL DATA; IMAGE SCANNERS; MICROANALYSIS; PHOSPHORS; PHOTON COMPUTED TOMOGRAPHY; X-RAY DETECTION
- Descriptors DEC
- ALLOYS; ALUMINIUM ALLOYS; COMPUTERIZED TOMOGRAPHY; CRYSTAL STRUCTURE; DATA; DETECTION; DIAGNOSTIC TECHNIQUES; INFORMATION; NUMERICAL DATA; RADIATION DETECTION; TOMOGRAPHY; TRANSITION ELEMENT ALLOYS
Optional Information
- Contract/Grant/Project number
- Grants APVV SK-PL-0059-09; APVV-0459-06; VEGA-2/0153/10; VEGA-2/0192/10; COST Action MP060
- Notes
- 5 figs., 4 refs. Imprint:Published also on CDROM 193 MBytes in PDF format