Non-spherical voids and lattice reorientation patterning in a shock-loaded Al single crystal
- 1. Section for Materials Science and Advanced Characterization, Department of Wind Energy, Technical University of Denmark, Risø Campus, Roskilde, DK-4000 (Denmark)
- 2. Materials Science & Technology Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN, 37830 (United States)
Description
An Al single crystal shock loaded in the <1 2 3> direction and captured at incipient spallation was examined by combining X-ray tomography, electron backscatter diffraction on a scanning electron microscope, and transmission electron microscopy (TEM). Octahedral voids with {1 1 1} faces were a characteristic feature in the spall region. Regular patterns of lattice reorientation were found around individual voids, with lattice rotation being up to 25–30°. Each reorientation pattern consists of a number of reoriented zones. The direction of lattice rotation varies systematically from one zone to another. Four groups of reorientation patterns were identified morphologically in the same metallographic section, which result from different sectioning positions relative to the voids and thus provide equivalently a "serial sectioning" investigation of the deformed volume around the voids. An analysis of the observed reorientation patterns based on active slip systems rationalizes the key features observed and suggests that the systematic reorientation patterns result from the dominance of a single slip system in each individual zone. Microstructures revealed by TEM in the spall region show formation of dislocation cells and extended dislocation boundaries, illustrating the importance of plastic deformation during void growth.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2017.05.035Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2017.05.035;
- PII
- S1359-6454(17)30422-6;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 134
- Journal Issue
- Complete
- Journal Page Range
- p. 16-30
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49045599
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTAL GROWTH; ELECTRON DIFFRACTION; ELECTRON SCANNING; MONOCRYSTALS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; VOIDS; X RADIATION; ZONES
- Descriptors DEC
- COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; IONIZING RADIATIONS; MICROSCOPY; RADIATIONS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.