Published February 15, 2012 | Version v1
Journal article

In-situ study of magnetic thin films on nanorippled Si (1 0 0) substrates

  • 1. UGC- DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore 452017 (India)

Description

Magnetic properties of ultrathin Co film on nanorippled Si substrate have been studied. Low energy ion beam erosion of Si (1 0 0) substrate has been used to produce nanoripples with the wavelength and amplitude of modulations being 32 nm and 1.2 nm, respectively. In-situ magneto-optical Kerr effect measurements have been used to study the evolution of the hysteresis loop with film thickness. The results are compared with those of Co film deposited on polished Si substrate. Co films on nanorippled surface exhibit a strong uniaxial magnetic anisotropy with its easy axis along a direction normal to the ripple wave vector. The magnetic anisotropy exhibits a monotonous decrease with increasing film thickness. Co film on nanorippled Si surface exhibits a magnetic dead layer of 0.8 nm because of possible intermixing of Co with Si to form non-magnetic silicide.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2011.07.105

Additional details

Identifiers

DOI
10.1016/j.apsusc.2011.07.105;
PII
S0169-4332(11)01172-X;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
258
Journal Issue
9
Journal Page Range
p. 4116-4121
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
International conference on ion-beam induced nanopatterning of materials
Acronym
IINM-2010
Dates
6-10 Feb 2011
Place
Bhubaneswar (India)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44031323
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANISOTROPY; COBALT; HYSTERESIS; ION BEAMS; KERR EFFECT; LAYERS; MAGNETIC PROPERTIES; MODULATION; SILICIDES; SILICON; SUBSTRATES; SURFACES; THICKNESS; THIN FILMS; WAVELENGTHS
Descriptors DEC
BEAMS; DIELECTRIC PROPERTIES; DIMENSIONS; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; METALS; PHYSICAL PROPERTIES; SEMIMETALS; SILICON COMPOUNDS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.