Published August 15, 1984 | Version v1
Journal article

Improved characteristics of Nb3Ge tunnel junctions using sputter-deposited amorphous-silicon barrier

  • 1. Research Institute of Applied Electricity, Hokkaido University, Sapporo, Japan

Description

We have fabricated Nb3Ge/amorphous-silicon/Pb Josephson tunnel junctions using high T/sub c/(> or =20 K) and stoichiometric (25 +- 1 at. %Ge) Nb3Ge films. Good I-V characteristic with large Josephson current I/sub c/ and high gap voltage is obtained when the amorphous-silicon barrier is sputter deposited at low rf voltage and high Ar pressure to reduce the damage to the Nb3Ge by the sputtered particles and to obtain good coverage over the Nb3Ge surface. Peculiar I-V characteristics showing the inverse ac Josephson effect and chaotic transition betwen current steps are observed in the response to microwave. The temperature dependence of I/sub c/ agrees well with the theoretical calculation when the Ge enrichment at the top surface of the Nb3Ge electrode is reduced

Additional details

Publishing Information

Journal Title
J. Appl. Phys.
Journal Volume
56
Journal Issue
4
Series
J. Appl. Phys.
Journal Page Range
1039-1043
ISSN
0021-8979