Published February 1, 2010
| Version v1
Journal article
Overcoming the field-of-view restrictions in soft x-ray holographic imaging
Creators
- 1. European Synchrotron Radiation Facility (ESRF), B.P. 220, F-38043 Grenoble Cedex (France)
- 2. Institut fuer Angewandte Physik, Universitaet Hamburg, Jungiusstrasse 11, D-20355 Hamburg (Germany)
- 3. Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, D-22607 Hamburg (Germany)
Description
We present a new concept for imaging by soft x-ray holography. Microscopylike imaging capabilities were achieved by the separation of mask and sample. The use of two independent silicon nitride membranes, one for the field-of-view-defining mask and the reference beam, and the other for the sample, allows to image different areas on the sample. The movement of the field-of-view across the sample is realized by a piezomotor-driven sample stage that permits relative and stable positioning with nm-precision. We demonstrate the capabilities of the x-ray holographic microscopy (XHM) technique by showing images with 60 nm spatial resolution of an artificially structured 100 nm thick gold film with a lateral size of 19 x 4 μm2.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/211/1/012024Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 211
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
Conference
- Title
- Polarized neutrons and synchrotron X-rays for magnetism conference 2009
- Dates
- 2-5 Aug 2009
- Place
- Bonn (Germany)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42051036
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- FILMS; GOLD; HOLOGRAPHY; IMAGES; MASKING; MEMBRANES; MICROSCOPY; POSITIONING; SILICON NITRIDES; SOFT X RADIATION; SPATIAL RESOLUTION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; METALS; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; RADIATIONS; RESOLUTION; SILICON COMPOUNDS; TRANSITION ELEMENTS; X RADIATION