A new Monte Carlo code for full simulation of silicon strip detectors
Creators
- 1. Dipartimento di Fisica 'Michelangelo Merlin' dell'Universita and INFN Sezione di Bari, via Amendola 173, I-70126 Bari (Italy)
Description
We have developed a full simulation code to evaluate the response of silicon strip detectors (SSDs) to ionizing particles. This simulation can be applied in the design stage of a SSD, when the detector parameters have to be chosen in order to optimize its performance.Our code allows to evaluate the electrical signals produced by ionizing particles crossing a SSD. All the physical processes leading to the generation of electron-hole pairs in silicon have been taken into account. Induced current signals on the readout strips are evaluated using the Shockley-Ramo theorem to the charge carriers propagating inside the detector volume. A simulation of the readout electronics has been implemented, to convert current signals into voltage signals.The predictions of our Monte Carlo simulation have been compared with experimental data taken using a 400μm thick silicon strip detector with a 228μm strip pitch exposed to a pion beam
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2004.05.127;
- PII
- S0168-9002(04)01353-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 533
- Journal Issue
- 3
- Journal Page Range
- p. 322-343
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37026752
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CHARGE CARRIERS; COMPUTERIZED SIMULATION; CURRENTS; DESIGN; ELECTRIC POTENTIAL; FORECASTING; HOLES; MONTE CARLO METHOD; PARTICLES; PERFORMANCE; PION BEAMS; PITCHES; SI MICROSTRIP DETECTORS; SIGNALS; SILICON
- Descriptors DEC
- BEAMS; CALCULATION METHODS; ELEMENTS; MEASURING INSTRUMENTS; MESON BEAMS; ORGANIC COMPOUNDS; OTHER ORGANIC COMPOUNDS; PARTICLE BEAMS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; SI SEMICONDUCTOR DETECTORS; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.