Published July 2015 | Version v1
Journal article

An algorithm for removing charging effects from X-ray photoelectron spectra of nanoscaled non-conductive materials

  • 1. Novosibirsk State University, Novosibirsk 630090 (Russian Federation)
  • 2. Boreskov Institute of Catalysis SB RAS, Novosibirsk 630090 (Russian Federation)

Description

Graphical abstract: - Highlights: • Algorithm for restoration of XP-spectra distorted by surface charging was developed. • Pd3d spectra of Pd/SnO2, Pd/CeO2–SnO2 catalysts were successfully restored. • Algorithm performance is comparable with "hardware" charging neutralization technique. - Abstract: Inhomogeneous surface charging could lead to a distortion of X-ray photoelectron (XP) spectra, which complicates the spectra analysis and sometimes results in an incorrect interpretation of elements chemical states of the sample. The charging effects might be especially strong in the case of XPS application for the characterization of heterogeneous catalysts, which are usually based on the dielectric or semiconductor materials with complex morphology. In this paper, we propose an algorithm to restore XP spectra when distortion is caused by inhomogeneous and/or non-constant surface charging effects. A photoelectron line of a reference element can be used to eliminate the distortions from experimental spectra of other elements by an iterative deconvolution procedure. The successful application of the algorithm for the restoration of a Pd3d line shape using a reference Sn3d5/2 line was demonstrated for the Pd/SnO2 and Pd/CeO2–SnO2 catalysts

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2015.03.008

Additional details

Identifiers

DOI
10.1016/j.elspec.2015.03.008;
PII
S0368-2048(15)00065-1;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
202
Journal Page Range
p. 89-101
ISSN
0368-2048
CODEN
JESRAW

Optional Information

Copyright
Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.