Published November 1, 2005 | Version v1
Journal article

Maximal information analysis: I - various Wayne State plots and the most common likelihood principle

Creators

  • 1. Physics Department, Wayne State University, 666 W Hancock Street, Detroit, MI 48201 (United States)

Description

Statistical analysis using all moments of the likelihood L(y vertical bar α) (y being the data and α being the fit parameters) is presented. The relevant plots for various data fitting situations are presented. The goodness of fit (GOF) parameter (currently the χ2) is redefined as the isoprobability level in a multidimensional space. Many useful properties of statistical analysis are summarized in a new statistical principle which states that the most common likelihood, and not the tallest, is the best possible likelihood, when comparing experiments or hypotheses

Additional details

Identifiers

DOI
10.1016/j.nima.2005.06.076;
PII
S0168-9002(05)01393-8;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
552
Journal Issue
3
Journal Page Range
p. 522-558
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37045056
Subject category
S99: GENERAL AND MISCELLANEOUS;
Descriptors DEI
DATA; DATA ANALYSIS; PROBABILITY; SPACE; STATISTICS
Descriptors DEC
INFORMATION; MATHEMATICS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.