Published November 1996
| Version v1
Miscellaneous
Open
FOCUS: time-of-flight spectrometer for cold neutrons at SINQ
Creators
- 1. Lab. for Neutron Scattering ETH Zurich, Zurich (Switzerland) and Paul Scherrer Institute, Villigen (Switzerland)
- 2. Saarbruecken Univ., Physical Chemistry, Saarbruecken (Germany)
Description
The physical layout of the Time-Of-Flight spectrometer at the new spallation source SINQ is presented. The concept shows up a hybrid-TOF combining a Fermi-chopper with a crystal monochromator. The demand of a versatile and flexible instrument for several applications is taken into account by the option of switching from time-focusing to monochromatic focusing mode such that the spectrometer can be optimised for both quasielastic and inelastic scattering applications. (author) 5 figs., 2 tabs., 16 refs
Files
28024543.pdf
Files
(274.5 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:f09d591330dc354b3788bf5b1f20a738
|
274.5 kB | Preview Download |
Additional details
Publishing Information
- Publisher
- Paul Scherrer Institut.
- Imprint Place
- Villigen (Switzerland)
- Imprint Title
- New instruments and science around SINQ. Lecture notes of the 4. summer school on neutron scattering
- Imprint Pagination
- 454 p.
- Series
- PSI-Proceedings 96-02.
- Journal Page Range
- p. 45-54.
- ISSN
- 1019-6447
- Report number
- PSI-PROC--96-02
Conference
- Title
- 4. Summer school on neutron scattering.
- Dates
- 18-24 Aug 1996.
- Place
- Zuoz (Switzerland).
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 28024543
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ELASTIC SCATTERING; EXPERIMENTAL DATA; FOCUSING; INELASTIC SCATTERING; MONOCHROMATORS; NEUTRONS; THEORETICAL DATA; TIME-OF-FLIGHT SPECTROMETERS
- Descriptors DEC
- BARYONS; DATA; ELEMENTARY PARTICLES; FERMIONS; HADRONS; INFORMATION; MEASURING INSTRUMENTS; NUCLEONS; NUMERICAL DATA; SCATTERING; SPECTROMETERS