Micro-radiography and micro-computerized tomography with absorption and phase contrast for materials characterization

The contribution describes modern techniques in micro-radiography and micro-computerized tomography for materials characterization using absorption and phase contrast. Using micro- and nano-focus tubes and adequate high.-resolution detectors it is possible to reach resolutions significantly below 1 micron. The CT technology allows in-situ deformation testing to study the damaging mechanism of materials. The application of the Talbot-Lau interferometer with CT a differential phase contrast tomography is available. Dark-field tomography is used to study individual carbon fiber bundles in carbon fiber reinforced laminates.