Published April 1996
| Version v1
Journal article
Glancing-incidence and - take-off X-ray fluorescence and scanning tunnelling microscopy of thin films under X-ray irradiation
Creators
- 1. Tohoku Univ., Sendai (Japan). Inst. for Materials Research
Description
We have measured Au and Ni thin films on a quartz glass using both scanning tunnelling microscopy (STM) and glancing-incidence and -take-off x-ray fluorescence (GIT-XRF). The STM image shows that the film surface consists of grains of several tens of nanometres in size. Although the GIT-XRF method utilizes a total reflection phenomenon which occurs on a flat surface, a surface roughness of 10 nm does not affect the GIT-XRF analysis. Moreover, we demonstrate for the first time that STM observation is possible under x-ray irradiation. (Author)
Additional details
Publishing Information
- Journal Title
- Surface and Interface Analysis
- Journal Volume
- 24
- Journal Issue
- 4
- Journal Page Range
- p. 286-289.
- ISSN
- 0142-2421
- CODEN
- SIANDQ
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 27052904
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DEPTH; GOLD; GRAIN SIZE; INCIDENCE ANGLE; IRRADIATION; NICKEL; ROUGHNESS; SCANNING ELECTRON MICROSCOPY; SPATIAL DISTRIBUTION; THIN FILMS; X RADIATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; CRYSTAL STRUCTURE; DIMENSIONS; DISTRIBUTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; IONIZING RADIATIONS; METALS; MICROSCOPY; MICROSTRUCTURE; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SIZE; SURFACE PROPERTIES; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS