Monolithic ionizing particle detector based on active matrix of functionally integrated structures
- 1. National University of Science and Technology "MISIS" (Russian Federation)
- 2. Lomonosov Moscow State University, Skobeltsyn Institute of Nuclear Physics (MSU SINP) (Russian Federation)
Description
Highlights: • A new type of monolithic silicon position detector is presented. • An operating principle, design and technology of the detector are described. • Calculated estimations of the detecting efficiency are carried out. • Experimental results of alpha-particle and electron detection are shown. -- Abstract: An operating principle, design and technology of a new type of the monolithic silicon position detector (MSPD) for registration of ionizing particles and photons are described. The detector represents a specialized monolithic silicon VLSI that contains a two-dimensional detecting matrix of active functionally integrated bipolar structures and peripheral electronic circuitry for signal amplification and processing. This paper presents experimental results of α-particles and electrons detection with position accuracy and operation speed better than 12.5 μm and 1 ns, respectively. The given estimations show the capabilities of this detector and its advantages in comparison with analogs
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2013.04.032Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2013.04.032;
- PII
- S0925-8388(13)00913-4;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 586
- Journal Issue
- Suppl.1
- Journal Page Range
- p. S553-S557
- ISSN
- 0925-8388
- CODEN
- JALCEU
Conference
- Title
- International symposium on metastable, amorphous and nanostructured materials
- Acronym
- ISMANAM 2012
- Dates
- 18-22 Jun 2012
- Place
- Moscow (Russian Federation)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45054184
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; ALPHA PARTICLES; EFFICIENCY; ELECTRON DETECTION; SILICON
- Descriptors DEC
- CHARGED PARTICLE DETECTION; CHARGED PARTICLES; DETECTION; ELEMENTS; IONIZING RADIATIONS; RADIATION DETECTION; RADIATIONS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.