Published February 15, 2014 | Version v1
Journal article

Monolithic ionizing particle detector based on active matrix of functionally integrated structures

  • 1. National University of Science and Technology "MISIS" (Russian Federation)
  • 2. Lomonosov Moscow State University, Skobeltsyn Institute of Nuclear Physics (MSU SINP) (Russian Federation)

Description

Highlights: • A new type of monolithic silicon position detector is presented. • An operating principle, design and technology of the detector are described. • Calculated estimations of the detecting efficiency are carried out. • Experimental results of alpha-particle and electron detection are shown. -- Abstract: An operating principle, design and technology of a new type of the monolithic silicon position detector (MSPD) for registration of ionizing particles and photons are described. The detector represents a specialized monolithic silicon VLSI that contains a two-dimensional detecting matrix of active functionally integrated bipolar structures and peripheral electronic circuitry for signal amplification and processing. This paper presents experimental results of α-particles and electrons detection with position accuracy and operation speed better than 12.5 μm and 1 ns, respectively. The given estimations show the capabilities of this detector and its advantages in comparison with analogs

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2013.04.032

Additional details

Identifiers

DOI
10.1016/j.jallcom.2013.04.032;
PII
S0925-8388(13)00913-4;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
586
Journal Issue
Suppl.1
Journal Page Range
p. S553-S557
ISSN
0925-8388
CODEN
JALCEU

Conference

Title
International symposium on metastable, amorphous and nanostructured materials
Acronym
ISMANAM 2012
Dates
18-22 Jun 2012
Place
Moscow (Russian Federation)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45054184
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; ALPHA PARTICLES; EFFICIENCY; ELECTRON DETECTION; SILICON
Descriptors DEC
CHARGED PARTICLE DETECTION; CHARGED PARTICLES; DETECTION; ELEMENTS; IONIZING RADIATIONS; RADIATION DETECTION; RADIATIONS; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.