Published February 2, 2015 | Version v1
Journal article

Electrostatic capacitance and Faraday cage behavior of carbon nanotube forests

  • 1. Department of Mechanical Engineering, Faculty of Engineering Sciences, Ben-Gurion University, Beer-Sheva (Israel)
  • 2. Mechanosynthesis Group, Department of Mechanical Engineering, University of Michigan, Ann Arbor, Michigan 48109 (United States)
  • 3. Department of Mechanical Engineering and Laboratory for Manufacturing and Productivity, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)

Description

Understanding of the electrostatic properties of carbon nanotube (CNT) forests is essential to enable their integration in microelectronic and micromechanical devices. In this study, we sought to understand how the hierarchical geometry and morphology of CNT forests determines their capacitance. First, we find that at small gaps, solid micropillars have greater capacitance, yet at larger gaps the capacitance of the CNT forests is greater. The surface area of the CNT forest accessible to the electrostatic field was extracted by analysis of the measured capacitance, and, by relating the capacitance to the average density of CNTs in the forest, we find that the penetration depth of the electrostatic field is on the order of several microns. Therefore, CNT forests can behave as a miniature Faraday cage. The unique electrostatic properties of CNT forests could therefore enable their use as long-range proximity sensors and as shielding elements for miniature electronic devices

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
106
Journal Issue
5
Journal Page Range
p. 053106-053106.4
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46126160
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CAPACITANCE; CARBON NANOTUBES; ELECTRONIC EQUIPMENT; FARADAY CUPS; MICROSTRUCTURE; PENETRATION DEPTH
Descriptors DEC
BEAM MONITORS; CARBON; ELECTRICAL PROPERTIES; ELEMENTS; EQUIPMENT; MEASURING INSTRUMENTS; MONITORS; NANOSTRUCTURES; NANOTUBES; NONMETALS; PHYSICAL PROPERTIES

Optional Information

Notes
(c) 2015 AIP Publishing LLC