Ridge extraction based on adaptive variable-bandwidth cost functions by edge detection of time frequency images
Creators
- 1. School of Information and Control Engineering, Weifang University, No. 5147 Dong Feng Dong Street, Weifang 261061 (China)
- 2. School of Mechatronics and Vehicle Engineering, Weifang University, No. 5147 Dong Feng Dong Street, Weifang 261061 (China)
Description
Ridge extraction of a time frequency image (TFI) can serve to estimate an instantaneous frequency of a signal. However, there is a considerable difficulty in ridge extraction of a multi-ridge TFI due to mutual interference between ridges. Some traditional methods for ridge extraction fail to resolve this difficulty. The one-step cost function (OSCF), a typical method for processing a multi-ridge TFI, lacks self-adaptation in determining searching regions of a targeted ridge. To overcome this question, this paper proposes an adaptive variable-bandwidth cost function (AVBCF) for ridge extraction. Firstly, a TFI is acquired by time frequency analysis of a signal. Afterwards, the TFI is filtered into a binary image by a Canny detector. Also, some dispersive ridges in the binary image serve to form a synthetic dispersive ridge. Next, searching regions of a targeted ridge are estimated by projecting statistics of edges of the synthetic dispersive ridge to the targeted ridge. Next, the AVBCF is compared with the OSCF and some widespread methods numerally and experimentally. The results demonstrate that the AVBCF performs better than the other methods. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6501/ab6278Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 31
- Journal Issue
- 5
- Journal Page Range
- [10 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52117666
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; DETECTION; EXTRACTION; FREQUENCY ANALYSIS; FUNCTIONS; IMAGES; PROCESSING; SIGNALS; STATISTICS
- Descriptors DEC
- EVALUATION; MATHEMATICS; SEPARATION PROCESSES