Published December 1997
| Version v1
Journal article
Single event latchup threshold estimation based on laser dose rate test results
- 1. Specialized Electronic Systems, Moscow (Russian Federation)
Description
Latchup comparative experimental and software simulation research were performed at various laser wavelengths, pulse durations and spot sizes. Single event to dose rate latchup correlation was found that provides the possibility of SEL threshold energy prediction based on laser dose rate test results
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 44
- Journal Issue
- 6Pt1
- Journal Page Range
- p. 2034-2039
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- 34. IEEE nuclear and space radiation effects conference
- Dates
- 21-25 Jul 1997
- Place
- Snowmass, CO (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 29060974
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPARATIVE EVALUATIONS; FAILURES; INTEGRATED CIRCUITS; LASER RADIATION; PHYSICAL RADIATION EFFECTS; RADIATION DOSES; SIMULATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; EVALUATION; RADIATION EFFECTS; RADIATIONS
Optional Information
- Secondary number(s)
- CONF-970711--