Published January 2018 | Version v1
Journal article

Ti1-x Sn x O2 nanofilms: Layer-by-layer deposition with extended Sn solubility and characterization

  • 1. Institute of Materials Research and Engineering, Agency for Science, Technology and Research - A*STAR, 2 Fusionopolis Way, Innovis, 08-03, Singapore 138634 (Singapore)
  • 2. Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576 (Singapore)
  • 3. Department of Physics, National University of Singapore, Singapore 117542 (Singapore)
  • 4. Singapore Synchrotron Light Source (SSLS), National University of Singapore, 5 Research Link, Singapore 117603 (Singapore)
  • 5. Institute of Chemical and Engineering Sciences, A*STAR, 1 Pesek Road, Jurong Island, Singapore 627833 (Singapore)
  • 6. Department of Mechanical Engineering, National University of Singapore, Singapore 117575 (Singapore)

Description

Highlights: • High quality epitaxial rutile Ti1-xSnxO2 nanofilms were grown in a layer-by-layer mode at a moderately low temperature of 400 °C. • Extended solid solubility of up to x = 0.216 has been achieved in the films for the first time despite unfavorable theoretical prediction by DFT. • Films possessed smooth interfaces and step-terraced surfaces and are optically transparent with well controlled stoichiometry. • Sn4+ ions are homogenously distributed in the films and are found to substitute Ti4+ in the lattice sites. High quality rutile Ti1-xSnxO2 nanofilms were successfully grown in a layer-by-layer mode at a moderately low temperature of 400 °C using pulsed laser deposition (PLD). High solid solubility of up to x = 0.216 has been achieved in the Ti1-xSnxO2 films despite theoretical prediction by Density functional theory (DFT) of large formation energy (∼5.64 eV) required for the substitutional alloy to exist at such high Sn concentration. The resultant films have smooth interfaces and step-terraced surfaces with well controlled stoichiometry and are optically transparent. Sn L3-edge Extended X-ray absorption fine structure (EXAFS) reveals the substitution of Sn4+ in the Ti4+ lattice sites of TiO2. The lattice spacing along [110] increases linearly with increment in x due to substitution of Sn4+ ions in the Ti lattice sites of the Ti1-xSnxO2 films. X-ray photoelectron spectroscopy (XPS) and Rutherford backscattering (RBS) show that Sn is uniformly distributed on the surface and in the bulk of the films. These results are crucial when considering Ti1-xSnxO2 with suitable composition for making TiO2 based quantum structures in advanced optoelectronic devices and solar energy materials, where high-quality crystalline thin film-substrates are important.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2017.09.135

Additional details

Identifiers

DOI
10.1016/j.apsusc.2017.09.135;
PII
S0169433217327836;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
428
Journal Page Range
p. 710-717
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2017 Elsevier B.V. All rights reserved.