Ti1-x Sn x O2 nanofilms: Layer-by-layer deposition with extended Sn solubility and characterization
- 1. Institute of Materials Research and Engineering, Agency for Science, Technology and Research - A*STAR, 2 Fusionopolis Way, Innovis, 08-03, Singapore 138634 (Singapore)
- 2. Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576 (Singapore)
- 3. Department of Physics, National University of Singapore, Singapore 117542 (Singapore)
- 4. Singapore Synchrotron Light Source (SSLS), National University of Singapore, 5 Research Link, Singapore 117603 (Singapore)
- 5. Institute of Chemical and Engineering Sciences, A*STAR, 1 Pesek Road, Jurong Island, Singapore 627833 (Singapore)
- 6. Department of Mechanical Engineering, National University of Singapore, Singapore 117575 (Singapore)
Description
Highlights: • High quality epitaxial rutile Ti1-xSnxO2 nanofilms were grown in a layer-by-layer mode at a moderately low temperature of 400 °C. • Extended solid solubility of up to x = 0.216 has been achieved in the films for the first time despite unfavorable theoretical prediction by DFT. • Films possessed smooth interfaces and step-terraced surfaces and are optically transparent with well controlled stoichiometry. • Sn4+ ions are homogenously distributed in the films and are found to substitute Ti4+ in the lattice sites. High quality rutile Ti1-xSnxO2 nanofilms were successfully grown in a layer-by-layer mode at a moderately low temperature of 400 °C using pulsed laser deposition (PLD). High solid solubility of up to x = 0.216 has been achieved in the Ti1-xSnxO2 films despite theoretical prediction by Density functional theory (DFT) of large formation energy (∼5.64 eV) required for the substitutional alloy to exist at such high Sn concentration. The resultant films have smooth interfaces and step-terraced surfaces with well controlled stoichiometry and are optically transparent. Sn L3-edge Extended X-ray absorption fine structure (EXAFS) reveals the substitution of Sn4+ in the Ti4+ lattice sites of TiO2. The lattice spacing along [110] increases linearly with increment in x due to substitution of Sn4+ ions in the Ti lattice sites of the Ti1-xSnxO2 films. X-ray photoelectron spectroscopy (XPS) and Rutherford backscattering (RBS) show that Sn is uniformly distributed on the surface and in the bulk of the films. These results are crucial when considering Ti1-xSnxO2 with suitable composition for making TiO2 based quantum structures in advanced optoelectronic devices and solar energy materials, where high-quality crystalline thin film-substrates are important.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2017.09.135Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2017.09.135;
- PII
- S0169433217327836;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 428
- Journal Page Range
- p. 710-717
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52122393
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; DENSITY FUNCTIONAL METHOD; ENERGY BEAM DEPOSITION; EPITAXY; FORMATION HEAT; INTERFACES; LASER RADIATION; LAYERS; NANOFILMS; OPTOELECTRONIC DEVICES; PULSED IRRADIATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SOLAR ENERGY; STANNATES; SUBSTRATES; TIN IONS; TITANIUM COMPOUNDS; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROSCOPY
- Descriptors DEC
- CALCULATION METHODS; CHARGED PARTICLES; CRYSTAL GROWTH METHODS; DEPOSITION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELECTRONIC EQUIPMENT; ENERGY; ENERGY SOURCES; ENTHALPY; EQUIPMENT; FILMS; IONS; IRRADIATION; MATERIALS; NANOMATERIALS; OPTICAL EQUIPMENT; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; RADIATIONS; REACTION HEAT; RENEWABLE ENERGY SOURCES; SPECTROSCOPY; SURFACE COATING; THERMODYNAMIC PROPERTIES; THIN FILMS; TIN COMPOUNDS; TRANSDUCERS; TRANSITION ELEMENT COMPOUNDS; VARIATIONAL METHODS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier B.V. All rights reserved.