Published October 1, 1991
| Version v1
Journal article
In0.53Ga0.47As metal-semiconductor-metal photodetector using proton bombarded p-type material
- 1. Department of Electrical and Computer Engineering, George Mason University, Fairfax, Virginia (USA)
- 2. Bellcore, Red Bank, New Jersey (USA)
- 3. Naval Research Laboratory, Washington, DC (USA)
Description
Metal-semiconductor-metal (MSM) photodetectors have been fabricated using as-grown and proton-bombarded p-type In0.53Ga0.47As. Proton bombardment caused a decrease in the dark current, an increase in the breakdown voltage, and an improvement in the speed of the MSM detector. The dark current of the MSM detector with 3x1015 cm-3 proton bombardment is 10 nA at 2 V and 300 nA at 5-V bias. The dc responsivity is 0.7 A/W and impulse response full width at half maximum is 160 ps for 1.3 μm radiation at 5 V bias
Additional details
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 70
- Journal Issue
- 7
- Series
- J. Appl. Phys.
- Journal Page Range
- 3943-3945
- ISSN
- 0021-8979
- CODEN
- JAPIA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23004669
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- FABRICATION; GALLIUM ARSENIDES; INDIUM ARSENIDES; P-TYPE CONDUCTORS; PERFORMANCE; PHOTOCURRENTS; PHOTODETECTORS; PHYSICAL RADIATION EFFECTS
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CURRENTS; ELECTRIC CURRENTS; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; MATERIALS; PNICTIDES; RADIATION EFFECTS; SEMICONDUCTOR MATERIALS