X-ray microprobe-microscopy
Creators
- 1. Metals and Ceramics Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831-6117 (United States)
Description
X-rays have a unqiue interaction with matter that offers many advantages over electrons and other charged particles for the microcharacterization of materials. X-rays are more efficient in photoejecting inner shell electrons resulting in characteristic x-ray fluorescence. X-rays also result in less Bremsstrahlung to produce higher fluorescent signal-to-background ratios than obtained with electrons. Detectable limits for x-ray produced fluorescence could be a few parts per billion which are 10-3 to 10-5 lower than for electron excitation. Energy deposition in the sample from x-rays is 10-3 to 10-4 less than for electrons for the same detectable limit. High-brightness storage rings, such as the planned Advanced Photon Source in the 7 GeV class with undulators, will have sources as brilliant as the most advanced electron probes
Additional details
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 215
- Journal Issue
- 1
- Journal Page Range
- p. 770-786.
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 15. international conference on X-ray and inner-shell processes.
- Acronym
- X-90
- Dates
- 9-13 Jul 1990.
- Place
- Knoxville, TN (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24003230
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ABSORPTION SPECTRA; BEAM OPTICS; COMPARATIVE EVALUATIONS; CROSS SECTIONS; ELECTRON MICROPROBE ANALYSIS; EXPERIMENTAL DATA; FLUORESCENCE; GEOLOGY; IRON ALLOYS; MICROSCOPY; NICKEL ALLOYS; ONE-DIMENSIONAL CALCULATIONS; PROBES; RADIATION SOURCES; SPATIAL RESOLUTION; STORAGE RINGS; SYNCHROTRON RADIATION; X RADIATION; X-RAY SPECTRA
- Descriptors DEC
- ALLOYS; BREMSSTRAHLUNG; CHEMICAL ANALYSIS; DATA; ELECTROMAGNETIC RADIATION; EMISSION; EVALUATION; INFORMATION; IONIZING RADIATIONS; LUMINESCENCE; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; PHOTON EMISSION; RADIATIONS; RESOLUTION; SPECTRA
Optional Information
- Secondary number(s)
- CONF-900757--.