Published September 15, 2009 | Version v1
Journal article

Charge transportation and permittivity in electron beam irradiated polymethyl methacrylate

  • 1. Pohl Institute of Solid State Physics, Tongji University, 1239 Siping Road, Shanghai 200092 (China)

Description

The charging phenomenon in the insulating dielectrics often occurs in the radiative environments such as in the outer space and in the nuclear reactor. Both surface charging and bulk charging have various influences on the dielectric properties. Understanding electrical properties of e-beam irradiated dielectrics is of great significance in order to maintain the stability and reliability of the related operating system. In this work, the effect of electron beam irradiation on the permittivity of polymethyl methacrylate (PMMA) samples was investigated. It was found that the variance of permittivity in e-beam irradiated PMMA is mainly determined by two factors. One is the porosity of the material. The irradiating process could increase the porosity of PMMA due to the escape of the small molecule (e.g., CO, CO2, and CH4) produced during material degradation caused by e-beam irradiation. The enhanced higher porosity corresponds to lower permittivity. The distribution of the implanted charge is the other factor that influences the permittivity. When the distribution of electric field generated by the accumulating charge is asymmetric for the middle thickness of the sample, the PMMA sample with polar groups would be subjected to extra polarization by the field, which could lead to the increase in permittivity. Combining with the model of Wakino et al. [J. Am. Ceram. Soc. 76, 2588 (1993)] on permittivity of mixture materials, the Clausius-Mosotti equation was utilized to analyze the variation in permittivity in the e-beam irradiated PMMA samples.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
106
Journal Issue
6
Journal Page Range
p. 064105-064105.6
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2009 American Institute of Physics